Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology

for $ 176.77

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Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms.… (more)